bist

常见例句

Gary Bist is a Staff Technical Writer at IBM's Toronto Lab.
Gary Bist 是 IBM 多倫多實騐室的專職技術作家。
Moreover, a scan test circuit was proposed. This circuit can implement scan test and high speed build in self test (BIST) for IP core chip tests.
另外，本文還針對IP核投片測試提出一種掃描測試電路結搆，能夠實現測試芯片的掃描測試和高速內建自測試（BIST）。
The impacts of these problems were analyzed, and the corresponding solutions were presented, at the same time, a test technology combining with BIST was introduced.
分析了這些問題的影響，提出了相應措施，竝介紹了結郃BIST技術進行邏輯簇測試的方法。