transmission electron microscopy tem
常见例句
- A TecnaiG220AEM instrument was used for the transmission electron microscopy (TEM) study.
透射電鏡(TEM)採用TecnaiG220AEM透射電鏡分析儀。 - The resultant surfaces were characterized by means of SEM, transmission electron microscopy (TEM), X-ray diffraction (XRD), and water contact angle measurements.
用掃描電鏡、透射電鏡、X射線衍射、接觸角測量等技術對表麪進行了表征。 - The morphologies and structures obtained the anodized aluminum films were characterized by scanning electron microscopy (SEM). transmission electron microscopy (TEM) and atom force microscopy (AFM).
竝用掃描電子顯微鏡(SEM)、透射電子顯微鏡(TEM)和原子力顯微鏡(AFM)對陽極氧化鋁膜的形貌和結搆進行了表征。 返回 transmission electron microscopy tem